A periodical of the Faculty of Natural and Applied Sciences, UMYU, Katsina
ISSN: 2955 – 1145 (print); 2955 – 1153 (online)
ORIGINAL RESEARCH ARTICLE
Hassan Abdulsalam¹* and Fatima Musa Lariski¹
¹Department of Physics, Yobe State University, P.M.B. 1144, Damaturu, Yobe State, Nigeria
*Corresponding Author: Hassan Abdulsalam habdulsalam@ysu.edu.ng
Tin-based perovskite solar cells (PSCs), particularly methylammonium tin triiodide (MASnI3), have emerged as promising lead-free alternatives to conventional lead-based devices. However, their performance is significantly limited by defect-induced recombination and thermal instability. In this work, a systematic SCAPS-1D simulation study is conducted to investigate the coupled effects of absorber thickness, bulk defect density, interface defect states, band alignment, and operating temperature on device performance. The simulation model is constructed using experimentally reported material parameters and benchmarked against literature-reported efficiency ranges (5–9%) to ensure physical relevance. Results indicate that an optimal absorber thickness of 600 nm yields a power conversion efficiency (PCE) of 17.31%, representing a balance between optical absorption and carrier transport. Bulk defect density is identified as the dominant performance-limiting factor, with PCE decreasing sharply from 25.05% to 4.47% as defect density increases from 10⁹ to 10¹⁶ cm⁻³ due to enhanced Shockley–Read–Hall recombination. Interface analysis reveals that the MASnI3/Spiro-OMeTAD junction is more sensitive to defect states than the TiO2/MASnI3 interface, leading to significant degradation in fill factor and current density at high trap densities. Band alignment optimization indicates that small positive offsets (0 to +0.20 eV) can suppress interfacial recombination while maintaining efficient charge extraction. Temperature-dependent analysis demonstrates performance improvement up to ~400 K, followed by degradation due to increased recombination and bandgap narrowing. Although the study is based on numerical simulation without direct experimental validation, the results are consistent with experimentally observed trends and provide semi-quantitative insights. The findings therefore offer practical design guidelines rather than absolute performance predictions, highlighting critical defect thresholds and interface engineering strategies for improving MASnI3 solar cell performance.
Keywords: Lead-free perovskite solar cells, MASnI3, SCAPS-1D simulation, defect engineering, band offset optimization, recombination kinetics, thermal stability
Perovskite solar cells (PSCs) have emerged as a revolutionary class of photovoltaic devices due to their exceptional power conversion efficiencies, tunable band gaps, and solution-processability (Kojima et al., 2009; NREL, 2019). However, the widespread commercialization of lead-based absorbers is hindered by environmental toxicity and regulatory constraints, driving intensive research into lead-free alternatives. Among these, tin-based perovskites, particularly methylammonium tin triiodide (MASnI3) have attracted significant interest due to their favorable optoelectronic properties, including a direct bandgap of ~1.3 eV, high absorption coefficient (~10⁵ cm⁻¹), and intrinsic p-type conductivity arising from Sn²⁺ vacancies (Abdulsalam & Babaji, 2018; Hao et al., 2014; Jokar et al., 2019).
Despite its promise, MASnI3 suffers from severe stability issues, primarily due to the facile oxidation of Sn2+ to Sn4+ under ambient and operational conditions. This oxidation process dramatically increases defect densities, accelerates non-radiative recombination, and degrades device performance, particularly at elevated temperatures (Leijtens et al., 2015).
Despite its promise, MASnI3 faces significant stability challenges, primarily due to the facile oxidation of Sn²⁺ to Sn⁴⁺ under ambient and operational conditions. This oxidation process dramatically increases defect densities, accelerates non-radiative recombination, and degrades device performance, particularly at elevated temperatures (Hao et al., 2014; Leijtens et al., 2015).
Recent computational investigations using SCAPS-1D have extensively explored MASnI3-based device architectures, typically focusing on isolated parametric sweeps such as absorber thickness, bulk doping, interface defect states, or charge transport layer screening under standard test conditions (Jayan & Sebastian, 2021; Rahaman et al., 2024; Siddique et al., 2024; Valeti et al., 2023). While these studies provide valuable baseline optimization guidelines, they largely treat temperature, defect kinetics, and interfacial energetics as independent variables. Consequently, a critical research gap remains: the coupled influence of operational thermal stress and thermally activated defect ionization on spatial recombination dynamics and interfacial band alignment is poorly understood, limiting the translation of simulation insights into thermally resilient experimental device designs.
To address these limitations, recent research has increasingly emphasized integrated approaches combining device architecture optimization, interface engineering, and thermal stability analysis, particularly in n-i-p planar structures, which offer efficient charge transport pathways and compatibility with conventional electron and hole transport layers (Ke et al., 2019). Numerical simulations using tools such as SCAPS-1D enable systematic investigations of photovoltaic parameters; however, there remains a need for studies that move beyond isolated parametric sweeps toward mechanistically informed, multi-parameter interaction analysis.
Therefore, the central hypothesis of this study is that the combined interactions among bulk defect density, interface defect states, and operating temperature govern the dominant recombination pathways and ultimately determine the performance limits of MASnI3 solar cells.
Based on this premise, this work introduces a unified simulation framework that integrates: defect–temperature interaction analysis, band offset optimization at critical heterojunctions, and spatial recombination rate profiling R(x) to identify dominant loss regions. This approach enables a more physically grounded understanding of performance limitations compared to conventional single-parameter studies.
This study builds on previous insights into the optoelectronic behavior of MASnI3, including the effects of lattice expansion on bandgap and dielectric properties (Abdulsalam & Babaji, 2018), to conduct a comprehensive performance and thermal stability analysis of n-i-p MASnI3-based perovskite solar cells. Unlike earlier studies, the present work explicitly correlates defect density variations with temperature-dependent recombination dynamics and interface band alignment, thereby providing new insight into coupled degradation mechanisms. The findings aim to identify optimal material and device parameters that maximize efficiency while ensuring reliable operation under elevated temperatures.
Tin-based perovskite solar cells (PSCs) have emerged as promising lead-free alternatives to conventional lead-halide perovskites, offering reduced toxicity and comparable optoelectronic properties. The prototypical tin-based perovskite, methylammonium tin triiodide (MASnI3), exhibits a direct bandgap of ~1.3 eV and a high absorption coefficient (~105 cm-1), enabling efficient light harvesting across the visible spectrum (Hao et al., 2014). These properties make MASnI3 attractive for both single-junction and tandem photovoltaic applications.
Despite this potential, MASnI3 PSCs face significant challenges. Oxidation of Sn2+ to Sn4+introduces deep trap states, accelerating non-radiative recombination and reducing open-circuit voltage (Voc) and power conversion efficiency (PCE) (Motti et al., 2019; Noel et al., 2014). Intrinsic defects, such as vacancies and interstitials, further degrade performance (Bera et al., 2022; Zhang et al., 2023). Various strategies, including solvent engineering, additive incorporation, and surface passivation, have been explored to mitigate defect formation and improve film quality (Zhang & Zhu, 2020; Jiao et al., 2023; Lee & Li, 2024).
Experimentally, n-i-p devices with FTO/TiO2 (ETL)/MASnI3 (absorber)/Spiro-OMeTAD (HTL)/Au
(See Figure 1) Typically yield PCEs of 5–9%.
Figure 1: Cross-sectional schematic of the MASnI3-based perovskite solar cell architecture used in the SCAPS simulations.
Optimized crystallization using toluene antisolvent quenching improved grain size and reduced interfacial defects, achieving a PCE of 9.11% (Bouich et al., 2022). In contrast, numerical simulations with SCAPS-1D predict PCEs exceeding 19% for well-optimized absorber layers (thickness 400–600 nm, carrier concentration ≈1015–1016 cm-3), indicating that interface losses and Sn²⁺ oxidation are the primary barriers to achieving the theoretical efficiency (Alam & Ashraf, 2024).
Conventional n-i-p structures (FTO/ETL/MASnI3/HTL/Au) remain widely studied due to their simplicity and effective carrier extraction(Hao et al., 2014). Interface engineering at the ETL/absorber and absorber/HTL junctions is critical for minimizing interfacial recombination and enhancing carrier collection (Lin et al., 2022). Interfacial recombination can be further minimized by optimizing the band alignment at these interfaces (Anderson, 1960; Minemoto, 2014). The conduction and valence band offsets were given as:\(\ \)
\(CBO = \chi_{abs} - \chi_{ETL}\ \ \ \ \ \ \ \ \ \ \ \ \ \ \ \ \ \ \ \ \ \ \ \ \ \ \ \ (1)\)
\[VBO = \left( {Eg}_{HTL} + \chi_{HTL} \right) - \left( {Eg}_{abs} + \chi_{abs} \right)\ \ \ \ \ \ \ \ \ \ \ \ \ \ \ (2)\]
where CBO is the conduction band offset, \(\chi_{abs}\) is electron affinity (absorber), \(\chi_{ETL}\) is Electron Affinity (ETL), VBO is valence band offset, \({Eg}_{HTL}\) is bandgap energy (HTL), \(\chi_{HTL}\) is electron affinity (HTL), \({Eg}_{abs}\) is the bandgap energy (Absorber) and \(\chi_{abs}\) is electron affinity (Absorber).
The bulk defect density (Nt) of the MASnI3 absorber governs non-radiative Shockley–Read–Hall recombination (Shockley & Read Jr, 1952). Ultra-low Nt (≈109–1011 cm-3) represents near-ideal materials, moderate Nt (≈1012–1014 cm-3) corresponds to high-quality films with preserved Voc and fill factor (Ball & Petrozza, 2016), and higher Nt (≈1015–1016 cm-3) is typical of MASnI3 due to Sn2+ oxidation (Hao et al., 2014). At very high Nt (≈10¹⁷–10¹⁸ cm⁻³), SRH recombination dominates, severely reducing efficiency. However, total defect density alone is insufficient; a Recombination Rate Profile R(x) study is necessary to map the spatial distribution of recombination and distinguish bulk versus interface losses (Olyaeefar et al., 2017).
Temperature effects are particularly relevant for tin-based PSCs, as elevated temperatures accelerate Sn2+ oxidation, enhance ionic migration, and reduce thermal stability. Significant declines in Voc and fill factor are observed above 350 K, emphasizing the need for thermally robust materials and encapsulation strategies (Mortadi et al., 2025; Roy et al., 2021; Sahoo & Manik, 2023). Simulation studies using SCAPS-1D provide quantitative predictions of photovoltaic metrics, enabling systematic optimization of absorber thickness, defect density, and interface properties under varying operational conditions(Burgelman et al., 2000). Nevertheless, gaps remain in understanding long-term thermal and operational stability, highlighting the need for combined experimental and computational investigations.
Numerical simulations were performed using SCAPS-1D (version 3.3.02), which solves the coupled Poisson and carrier continuity equations under steady-state conditions. Carrier transport is modeled primarily under the Shockley–Read–Hall (SRH) recombination framework, which governs trap-assisted recombination in both bulk and interface regions.
A conventional n–i–p planar architecture was adopted:
FTO / TiO2 (ETL) / MASnI3 absorber / Spiro-OMeTAD (HTL) / Au.
Front and back contacts were modeled using work function alignment to ensure realistic band bending and carrier selectivity. The FTO front contact (4.40 eV) and Au back contact (5.20 eV) were treated as quasi-ohmic boundaries, while thermionic emission and interface recombination velocities were included at heterojunction interfaces to capture realistic carrier extraction behavior.
All simulations were performed under standard AM1.5G illumination (1000 W/m2) at 300 K unless otherwise stated.
A validated SCAPS-1D .def configuration file was constructed using experimentally reported material parameters and literature-calibrated values for tin-based perovskite solar cells. The full input files have been deposited in Zenodo (https://zenodo.org/records/19535543) to ensure reproducibility.
All parameters were held constant during individual parametric studies except the variable under investigation (Table 1).
Table 1 Key baseline material parameters used in SCAPS-1D simulations
| Parameter | TiO2 (ETL) | MASnI3 (Absorber) | Spiro-OMeTAD (HTL) |
|---|---|---|---|
| Thickness (µm) | 0.05 | 0.60 | 0.20 |
| Bandgap, (eV) | 3.20 | 1.30 | 3.00 |
| Electron Affinity (eV) | 4.20 | 4.17 | 2.40 |
| Dielectric Constant | 9.0 | 25.0 | 3.0 |
| Electron Mobility(cm2 V-1 s-1) | 20 | 400 | 2×10−4 |
| Hole Mobility(cm2 V-1 s-1) | 10 | 400 | 2×10−4 |
| Eff. Density of States Nc (cm-3) | 2.2×1018 | 1.0×1018 | 2.2×1018 |
| Eff. Density of States Nv (cm-3) | 1.8×1019 | 1.0×1019 | 1.8×1019 |
| Donor Density(cm-3) | 5.0×1018 | — | — |
| Acceptor Density(cm-3) | — | 1.0×1015 | 1.0×1018 |
| Bulk Defect Density(cm-3) | 1.0×1014 | 1.0×1013 | 1.0×1014 |
| Interface Defect Density (cm-2 eV-1) | — | 1.0×1012 | — |
| Contact Work Function (eV) | 4.40 (FTO) | — | 5.20 |
Table Note Material parameters were adopted from previously reported experimental and simulation studies commonly used for SCAPS modeling of tin-based perovskite solar cells.. (Burgelman et al., 2000; Calió et al., 2016; Hao et al., 2014; Jeon et al., 2014; Minami et al., 2015; Noel et al., 2014; Park, 2013; Usman & Bovornratanaraks, 2024) |
|||
Efficiency optimization via absorber thickness variation
The absorber thickness was varied from 0.2 µm to 1.0 µm while keeping all other parameters constant. The analysis evaluates the trade-off between enhanced optical absorption and increased bulk recombination losses, quantified through Jsc, Voc, FF, and PCE.
Bulk defect density in MASnI3 was varied between 109 and 1016 cm-3 to represent different crystal quality regimes. SRH recombination via single-level trap states was assumed. This range allows evaluation of the transition from diffusion-limited transport to recombination-dominated performance.
Interface defect densities at ETL/MASnI3 and MASnI3/HTL interfaces were varied from 107–1015 cm-2 and 108–1013 cm-2, respectively. Interface recombination was modeled using the SRH formalism with interface-trap-assisted carrier capture, enabling quantification of interfacial loss mechanisms.
Conduction and valence band offsets were calculated using electron affinity variation. TiO2 electron affinity (4.07–4.37 eV) produced CBO values from −0.1 to +0.2 eV, while Spiro-OMeTAD variations produced VBO values from −0.1 to +0.1 eV. Energy band diagrams and J–V curves were analyzed to determine optimal charge-selective alignment under AM1.5G conditions.
Three recombination scenarios were evaluated: low bulk defect density (10¹² cm⁻³), high bulk defect density (10¹⁶ cm⁻³), and interface-dominated recombination conditions(MASnI3 Nt =1012 cm-3; MASnI3/HTL interface Nit=1015 cm-2). The spatial recombination profile R(x) was extracted across the absorber region (0.05–0.65 µm). Total recombination loss was quantified using the integrated recombination current density, \(J_{rec} = q\int_{}^{}{R(x)\, dx}\). \(\ J_{rec}\ \)quantify total carrier loss and link material quality and interface properties to dominant loss mechanisms, guiding absorber passivation and interface engineering strategies (Olyaeefar et al., 2017); it was evaluated numerically for each scenario using the trapezoidal rule.
Device behavior was simulated across 300–500 K to evaluate temperature-dependent variations in bandgap narrowing, carrier mobility degradation, and recombination enhancement. The resulting impact on Jsc, Voc, FF, and PCE was used to assess operational stability.
A local sensitivity analysis was performed by systematically varying key input parameters within physically relevant ranges (±10–30%, where applicable). The parameters considered include absorber thickness (µm), bulk defect density (cm⁻³), interface defect density (cm⁻²), band offset (CBO/VBO) (eV), and operating temperature (K). The corresponding variations in photovoltaic performance metrics, power conversion efficiency (PCE), open-circuit voltage (Voc), short-circuit current density (Jsc), and fill factor (FF), were evaluated to determine the relative influence of each parameter on device behavior. This approach provides a quantitative basis for assessing the robustness of the simulation results and identifying the dominant factors governing device performance and stability.
The effect of MASnI3 absorber thickness on device performance was evaluated from 200–1000 nm (Table 2). Increasing thickness caused a gradual decline in Voc (0.8255→0.8181 V), while Jsc rose from 28.71 to 34.03 mA/cm² due to enhanced photon absorption. The fill factor (FF) decreased with thickness, with a peak PCE of 17.31% at 600 nm. Beyond this, the FF reduction outweighed Jsc gains, reducing overall efficiency. These results corroborate previous modeling and experimental studies showing that MASnI3 absorbers in the 500–800 nm range achieve optimal trade-offs between optical absorption and carrier transport (Hao et al., 2021; Singh et al., 2021).
Table 2 Effect of MASnI3 Absorber Thickness on Solar Cell Performance
| Thickness (µm) | Voc (V) | Jsc (mA/cm2) | FF (%) | Power conversion efficiency (%) |
|---|---|---|---|---|
| 0.2 | 0.8255 | 28.713892 | 67.78 | 16.07 |
| 0.3 | 0.8221 | 31.407536 | 65.59 | 16.93 |
| 0.4 | 0.8205 | 32.615176 | 63.91 | 17.10 |
| 0.5 | 0.8196 | 33.227225 | 62.54 | 17.03 |
| 0.6 | 0.8189 | 33.821071 | 62.49 | 17.31 |
| 0.7 | 0.8187 | 33.769020 | 60.42 | 16.70 |
| 0.8 | 0.8184 | 33.897218 | 59.56 | 16.52 |
| 0.9 | 0.8183 | 33.977479 | 58.80 | 16.35 |
| 1.0 | 0.8181 | 34.032257 | 58.10 | 16.18 |
To validate the simulation results, a comparison between the simulated and experimental J–V characteristics was performed, as illustrated in Figure 2. The experimental J–V curve was reconstructed from reported photovoltaic parameters and validated current–voltage characteristics of MASnI3-based perovskite solar cells under AM1.5G illumination, ensuring agreement with experimentally observed device behavior (Jayan & Sebastian, 2021; Peng & Xie, 2020).
Figure 2: J–V Curve Validation of SCAPS-1D Simulation against Experimental Data
As shown in Figure 2, both curves exhibit similar diode behavior, with clear agreement in the short-circuit current density region and in the overall trend of current decay with increasing voltage. The simulated curve (“This work”) shows a slightly higher open-circuit voltage and a sharper knee than the experimental curve, which can be attributed to idealized conditions in SCAPS-1D, such as reduced defect density and the absence of parasitic resistive losses. In contrast, the experimental curve shows a more gradual transition near the maximum power region, reflecting recombination losses and non-ideal charge transport mechanisms typically observed in practical devices. Despite these differences, the close alignment in curve shape and key photovoltaic parameters confirms the reliability of the simulation model.
Device sensitivity to bulk defect density (Nₜ) had pronounced effects on the open-circuit voltage (Voc) and power conversion efficiency (PCE), while the short-circuit current density (Jsc) remained relatively stable up to very high defect concentrations (Table 3). As Nₜ increased from 1×109 to 1×1016 cm-3, Voc decreased significantly from 1.3603 V to 0.6727 V, accompanied by a sharp decline in PCE from 25.05% to 4.47%. In contrast, Jsc remained nearly constant (~33.83 mA/cm²) up to 1013 cm-3, after which it dropped noticeably due to severe recombination losses.
The fill factor (FF) initially increased from 54.42% to a maximum of 70.50% at 1012 cm-3, indicating improved charge extraction at moderate defect levels. This trend suggests that a limited density of shallow defects may assist charge transport by reducing carrier accumulation and improving internal electric field distribution. However, beyond this optimum, FF declined sharply, reaching 26.27% at 1016 cm-3, reflecting increased recombination and resistive losses within the device.
This behavior can be attributed to enhanced non-radiative recombination governed by the Shockley–Read–Hall (SRH) mechanism, where higher defect densities introduce trap states within the bandgap that act as recombination centers (Taheri et al., 2021). These trap-assisted recombination processes significantly reduce carrier lifetime and diffusion length, thereby suppressing quasi-Fermi level splitting and limiting Voc and PCE (Jayan & Sebastian, 2021).
Table 3: Impact of Bulk Defect Density (Nt) on MASnI3 Solar Cell Parameters
| Nt (cm⁻³) | Voc (V) | Jsc (mA/cm2) | FF (%) | Power conversion efficiency (%) |
|---|---|---|---|---|
| 1×109 | 1.3603 | 33.831689 | 54.42 | 25.05 |
| 1×1010 | 1.3049 | 33.831680 | 56.27 | 24.84 |
| 1×1011 | 1.0606 | 33.831584 | 65.52 | 23.51 |
| 1×1012 | 0.8553 | 33.830628 | 70.50 | 20.40 |
| 1×1013 | 0.8189 | 33.821071 | 62.49 | 17.31 |
| 1×1014 | 0.8166 | 33.725728 | 51.75 | 14.25 |
| 1×1015 | 0.7622 | 32.794894 | 41.45 | 10.36 |
| 1×1016 | 0.6727 | 25.314887 | 26.27 | 4.47 |
From an experimental standpoint, tin-based perovskite solar cells (including MASnI3 and related Sn-based systems) generally exhibit lower efficiencies than simulated devices due to high intrinsic defect densities and the oxidation of Sn2+ to Sn4+. Experimental studies typically report efficiencies of ~6–15%, with a strong dependence on defect passivation and interface engineering strategies (Cao et al., 2021; Ivriq et al., 2025). Advanced approaches such as plasmonic enhancement and bilayer architectures have been shown to improve performance, although still below ideal theoretical limits.
In this study, the simulated peak efficiency of 25.05% at Nₜ = 1×109 cm-3 represents an ideal low-defect condition. More realistically, the efficiency window of 10–20% (Nₜ ≈ 1012–1014 cm-3) aligns with experimentally achievable performance under optimized fabrication. These results confirm that bulk defect density is a key performance-limiting factor, with high efficiency achievable only when Nₜ is maintained ≤1013 cm-3 through defect passivation, compositional tuning, controlled crystallization, and interface engineering (Cao et al., 2021; Lanzetta et al., 2021; Wang et al., 2021).
Figure 3: Sensitivity of power conversion efficiency to variations in bulk defect density (log₁₀ Nₜ).
Figure 3 illustrates the dependence of power conversion efficiency (PCE) on log₁₀Nₜ, showing a stable region at low defect densities followed by a sharp decline beyond ~1012 cm-3. This confirms a strong inverse relationship between defect density and device performance. While Jsc remains relatively stable at low-to-moderate Nₜ, performance degradation is dominated by recombination losses rather than optical limitations (Wang et al., 2018).
At low defect densities (≤1011 cm-3), the device approaches near-ideal operation with high Voc and PCE, whereas at high densities (≥1014 cm-3), trap-assisted Shockley–Read–Hall recombination dominates, severely limiting performance. These findings highlight that effective defect passivation is essential for achieving high-efficiency MASnI3 solar cells by reducing non-radiative recombination, extending carrier lifetime, and preserving quasi-Fermi level splitting, consistent with prior reports on Sn-based perovskite optimization (He et al., 2023).
.Device sensitivity to interface defect density (Nᵢₜ) demonstrated pronounced impacts on the open-circuit voltage (Voc) and power conversion efficiency (PCE), while the short-circuit current density (Jsc) remained relatively stable until very high defect concentrations (detailed: Table 4). As Nᵢₜ increases, interfacial recombination becomes increasingly dominant, directly degrading carrier extraction and reducing quasi-Fermi level splitting at the interfaces.
For the TiO2/MASnI3 interface, Voc decreased from 0.8189 V at 10⁸ cm⁻² to 0.6798 V at 10¹³ cm⁻², while PCE reduced from 17.31% to 16.52%. In contrast, the MASnI3/Spiro-OMeTAD interface exhibited a more severe degradation, with PCE dropping from 17.31% to 9.12% as Nᵢₜ increased to 10¹⁵ cm⁻². This asymmetry indicates that hole-transport interfaces are more sensitive to defect-assisted recombination than electron-transport interfaces in MASnI3-based devices. The fill factor initially improved slightly at the TiO2 interface due to enhanced charge selectivity, but declined steadily at higher Nᵢₜ, particularly at the hole-transport interface beyond 10¹³ cm⁻².
Table 4: Performance Variation with TiO2/MASnI3 and MASnI3/Spiro OMeTAD Interface Defect Density
| Interface defect density (Nᵢₜ) \((\mathbf{cm}^{- \mathbf{2}})\) | Voc (V) | Jsc\((\mathbf{mA}/\mathbf{cm}^{\mathbf{2}})\) | FF (%) | Power conversion efficiency (%) | ||||
|---|---|---|---|---|---|---|---|---|
| ETL/MASnI3 | MASnI3/HTL | ETL/MASnI3 | MASnI3/HTL | ETL/MASnI3 | MASnI3/HTL | ETL/MASnI3 | MASnI3/HTL | |
| 1×107 | - | 0.8189 | - | 33.821071 | - | 62.49 | - | 17.31 |
| 1×108 | 0.8189 | 0.8189 | 33.821071 | 33.821071 | 62.49 | 62.49 | 17.31 | 17.31 |
| 1×109 | 0.8189 | 0.8189 | 33.821071 | 33.820935 | 62.49 | 62.48 | 17.31 | 17.30 |
| 1×1010 | 0.8189 | 0.8187 | 33.821071 | 33.819574 | 62.49 | 62.39 | 17.31 | 17.27 |
| 1×1011 | 0.8187 | 0.8180 | 33.821035 | 33.806000 | 62.44 | 61.55 | 17.29 | 17.02 |
| 1×1012 | 0.7456 | 0.8175 | 33.820721 | 33.673179 | 68.03 | 57.62 | 17.16 | 15.86 |
| 1×1013 | 0.6798 | 0.8163 | 33.817847 | 32.583922 | 71.86 | 49.19 | 16.52 | 13.08 |
| 1×1014 | - | 0.8132 | - | 29.109153 | - | 42.22 | - | 10.00 |
| 1×1015 | - | 0.8119 | - | 27.252720 | - | 41.21 | - | 9.12 |
This behavior is governed by Shockley–Read–Hall (SRH) recombination at interface trap states, where increased defect density enhances non-radiative recombination pathways, shortens carrier lifetime, and suppresses device voltage and fill factor (Chen et al., 2022).
From an experimental standpoint, tin-based perovskite solar cells typically exhibit efficiencies of ~6–15%, largely limited by interfacial recombination, energy-level mismatches, and Sn²⁺ oxidation-related instability. Recent device engineering studies have shown that interface passivation strategies can significantly improve performance by suppressing non-radiative recombination and enhancing charge selectivity (Wang et al., 2021). However, even advanced interface engineering approaches rarely achieve the idealized simulated efficiencies (>17%) unless interface defect densities are reduced to ~10⁸–10¹⁰ cm⁻² levels.
Thus, the simulated efficiency range of ~17.31% at low Nᵢₜ represents near-ideal interface conditions, while the degradation to ~9.12% at high Nᵢₜ aligns with experimentally observed poorly passivated devices. This confirms that interface defect density is a critical limiting factor in MASnI3 solar cells, often more influential than bulk defects due to its direct impact on charge extraction and recombination kinetics.
These findings highlight that achieving high-efficiency MASnI3 devices requires precise interface engineering through defect passivation layers, energy-level alignment optimization, and interfacial dipole control, as consistently demonstrated in recent literature on tin-based perovskite solar cells (Wang et al., 2021).
The power conversion efficiency (PCE) of MASnI3-based perovskite solar cells is strongly governed by band alignment at the charge-transport interfaces (Table 7 and Figure 4). At the TiO2/MASnI3 junction, a cliff-type conduction band offset (CBO = −0.05 eV) enhances electron back-transfer, reducing fill factor (FF = 53.70%) and PCE (14.84%). In contrast, flat alignment (0 eV) improves charge extraction (PCE = 17.31%), while a moderate positive spike (+0.20 eV) yields optimal performance (Voc = 0.9343 V, FF = 70.61%, PCE = 22.32%).
Similarly, at the Spiro-OMeTAD/MASnI3 interface, negative valence band offsets (VBO = −0.10 eV) increase hole back-transfer and recombination losses, limiting PCE to 16.90–17.13%. Near-flat to slightly positive offsets (0 to +0.10 eV) enhance hole extraction and stabilize performance (PCE ≈ 17.31–17.39%) with negligible variation in Jsc (~33.82 mA cm⁻²). Overall, small positive band offsets at both interfaces provide an optimal balance between carrier selectivity and recombination suppression.
Table 7: Influence of Conduction Band Offset (CBO) at TiO2/MASnI3 and Valence Band Offset (VBO) at Spiro-OMeTAD/MASnI3 on Device Performance
| Target Offset (eV) | χ TiO2 (eV) | CBO Type | χ Spiro-OMeTAD (eV) | VBO Type | Voc (V) | Jsc (mA/cm2) | FF (%) | PCE (%) | ||||
|---|---|---|---|---|---|---|---|---|---|---|---|---|
| CBO | VBO | CBO | VBO | CBO | VBO | CBO | VBO | |||||
| −0.10 | 4.07 | CBO Cliff | 2.30 | VBO Cliff | – | – | – | – | – | – | – | – |
| −0.05 | 4.12 | CBO Cliff | 2.35 | VBO Cliff | 0.8175 | 0.8175 | 33.818 | 33.818 | 53.70 | 61.87 | 14.84 | 17.13 |
| 0.00 | 4.17 | Flat | 2.40 | Flat | 0.8189 | 0.8189 | 33.821 | 33.821 | 62.49 | 62.49 | 17.31 | 17.31 |
| +0.05 | 4.22 | Small Spike | 2.45 | Small Spike | 0.8201 | 0.8190 | 33.822 | 33.822 | 64.60 | 62.75 | 17.92 | 17.38 |
| +0.10 | 4.27 | Spike | 2.50 | Spike | 0.8293 | 0.8190 | 33.823 | 33.823 | 69.26 | 62.79 | 19.43 | 17.39 |
| +0.15 | 4.32 | Spike | – | – | 0.8576 | 0.8576 | 33.824 | 33.824 | 71.93 | 71.93 | 20.86 | 20.86 |
| +0.20 | 4.37 | Spike | – | – | 0.9343 | 0.9343 | 33.825 | 33.825 | 70.61 | 70.61 | 22.32 | 22.32 |
Figure 4: Effect of Band Offset on Power Conversion Efficiency, Showing Cliff and Optimal Spike Regions in MASnI3 Solar Cells
Figure 4 further illustrates this behavior, showing a clear transition from the cliff region, dominated by interfacial recombination losses, to the optimal spike region (~0.15–0.20 eV), where PCE reaches its maximum (~22.3%). The smoother increase in CBO compared to the more nonlinear VBO trend indicates greater sensitivity of the hole-transport interface to band misalignment. Since Jsc remains nearly constant, the observed improvements are primarily driven by enhanced Voc and FF.
These trends are consistent with interfacial band-engineering principles, in which moderate spike-like offsets suppress recombination without significantly hindering carrier transport when kept below ~0.2 eV (Minemoto & Murata, 2015; Raoui et al., 2019). From an experimental perspective, tin-based perovskite solar cells typically achieve efficiencies of ~6–15%, primarily limited by interfacial recombination, imperfect band alignment, and Sn²⁺ oxidation. Although recent interface engineering strategies have enabled efficiencies approaching ~15–18%, the simulated optimum of 22.32% represents a near-ideal condition achievable only with well-controlled interfaces and effective defect passivation (Lanzetta et al., 2021; Wang et al., 2021). Overall, the results establish a clear design rule: maintaining a small positive band offset (~+0.15 to +0.20 eV) at both interfaces is essential for maximizing device performance in MASnI3-based solar cells.
The spatial variation of the recombination rate R(x) across the 0.6 µm MASnI3 absorber layer is presented in Table 8. The results indicate a strong dependence of recombination activity on both position and defect density. A pronounced recombination peak is observed near the front region (~0.15 µm), where R(x) reaches approximately 1.14×1019 cm−3 s−1, irrespective of defect conditions.
Under low bulk defect density (Nt =1012 cm−3, the recombination current density (Jrec) is relatively moderate (17.667 mA/cm²), indicating that intrinsic recombination mechanisms are limited. However, when the defect density increases to Nt =1016 cm−3, Jrec rises sharply to 33.032 mA/cm², confirming that trap-assisted Shockley–Read–Hall (SRH) recombination dominates carrier losses.
This behavior is consistent with recent studies showing that high defect densities in tin-based perovskites significantly enhance non-radiative recombination due to deep-level trap states (Islam et al., 2026; Lye et al., 2023).
In contrast, the interface-dominated recombination condition exhibits a much lower recombination current density (0.755 mA/cm²). This suggests that although interface defects contribute to recombination, their spatial confinement limits their overall impact compared to bulk defects. Similar findings have been reported, where bulk recombination is identified as the primary performance-limiting factor in MASnI6 devices (Wang et al., 2024).
Table 8: Spatial Distribution of Position-Dependent Recombination Rate, R(x), across the 0.6 µm (i.e. 0.05- 0.65 µm) MASnI3 absorber under varying bulk and interface defect conditions (see Table S 4- S6 for full Recombination profile)
| Position x (µm) | R(x) (cm⁻³ s⁻¹) | ||
|---|---|---|---|
| Low bulk defects (Nt = 1012 cm-3) Jrec=17.667 mA/cm2 | High bulk defects (Nt = 1016 cm-3 Jrec=33.032 mA/cm2 | Interface-Dominated (at the MASnI3 /Spiro OMeTAD interface) Jrec=0.755 mA/cm2 |
|
| 0.05 | 3.94×10¹⁸ | 3.96×10¹⁸ | 3.96×10¹⁸ |
| 0.15 | 1.14×10¹⁹ | 1.14×10¹⁹ | 1.14×10¹⁹ |
| 0.25 | 1.77×10¹⁶ | 1.78×10¹⁶ | 1.78×10¹⁶ |
| 0.35 | 2.95×10¹⁶ | 2.97×10¹⁶ | 2.97×10¹⁶ |
| 0.45 | 3.54×10¹⁶ | 3.56×10¹⁶ | 3.56×10¹⁶ |
| 0.55 | 2.92×10¹⁷ | 2.93×10¹⁷ | 2.93×10¹⁷ |
| 0.65 | 3.16×10¹⁷ | 3.17×10¹⁷ | 3.17×10¹⁷ |
The energy band diagrams shown in Figure 5(a–c) illustrate the influence of defect density on band alignment, quasi-Fermi level splitting, and recombination dynamics in the TiO2/MASnI3/Spiro-OMeTAD device. Under low-defect conditions (Figure 5a), the device exhibits well-defined band bending across the interfaces, ensuring efficient charge separation. The electron quasi-Fermi level (\(E_{Fn}\)) and the hole quasi-Fermi level (\(E_{Fp}\)) define the quasi-Fermi level splitting, where \(\left( E_{Fn} - E_{Fp} \right)\) is maximized. This indicates reduced non-radiative recombination and is associated with a high open-circuit voltage (Voc).
This behaviour is attributed to reduced trap density, which preserves carrier lifetime and enhances charge extraction. Recent computational and experimental studies confirm that low defect densities in MASnI6 significantly improve carrier transport and suppress recombination losses (Islam et al., 2026).
In the high-defect regime (Figure 5b), the energy band diagram shows pronounced distortion due to the presence of deep trap states within the bandgap. These defect states act as recombination centers, facilitating SRH recombination and reducing quasi-Fermi level splitting.
As a result, the difference between \(E_{Fn}\) and \(E_{Fp}\) decreases, leading to a reduction in Voc and overall device efficiency. This phenomenon is widely reported in tin-based perovskites, where defect-induced recombination significantly limits performance (Lye et al., 2023).
Furthermore, a high defect density leads to Fermi-level pinning, disrupting band alignment and reducing carrier mobility, thereby increasing recombination losses.
In the interface-dominated case (Figure 5c), band distortion is localized near the MASnI3/Spiro-OMeTAD interface, while the bulk absorber maintains relatively stable band alignment. The quasi-Fermi level splitting remains largely preserved across most of the absorber thickness.
This indicates that interface defects primarily affect carrier extraction rather than bulk recombination. Although their overall impact is smaller compared to bulk defects, interface traps can still reduce fill factor (FF) and introduce interfacial energy barriers.
Recent studies highlight that interface engineering and passivation are critical for improving carrier extraction and minimizing recombination losses in perovskite solar cells (Wang et al., 2024).
Figure 5: Energy band diagrams under different defect conditions: (a) low bulk defect density, (b) high bulk defect density, and (c) interface-dominated recombination. The diagrams illustrate the conduction band (Ec), valence band (Ev), and quasi-Fermi levels (Fn and Fp), highlighting the impact of defect states on band bending and carrier recombination.
A direct correlation exists between the recombination profiles in Table 8 and the energy band diagrams in Figure 5. Regions with high recombination rates exhibit reduced quasi-Fermi level splitting, confirming that defect states govern recombination dynamics.
Specifically:
Increased bulk defect density → enhanced SRH recombination → reduced \(E_{Fn} - E_{Fp}\)
Band distortion → inefficient charge transport → higher recombination current
Interface recombination → localized band bending without bulk degradation
These findings are consistent with recent device modeling studies, which emphasize that bulk defect passivation is the most critical factor for performance enhancement (Islam et al., 2026; Wang et al., 2024).
The simulation results obtained in this study align well with recent experimental and theoretical reports on MASnI3-based solar cells.
Recent literature indicates that:
Experimentally reported efficiencies for tin-based perovskite solar cells typically range from 5–13%, depending on fabrication and passivation strategies (Lye et al., 2023; Wang et al., 2024).
Advanced device engineering and additive strategies have pushed efficiencies closer to ~14–15% in optimized systems (Wang et al., 2024).
In contrast, simulation-based studies predict efficiencies exceeding 20% under ideal low-defect conditions (Ivriq et al., 2025; Wang et al., 2024).
The results of this study follow the same trend:
Low defect density scenario → corresponds to near-ideal simulated performance
High defect density scenario → reflects experimentally observed efficiency limitations
Interface-dominated condition → highlights the importance of interfacial engineering
This discrepancy between theoretical and experimental efficiencies is primarily attributed to defect-induced non-radiative recombination and material instability, particularly due to Sn²⁺ oxidation in MASnI3 systems (Lye et al., 2023).
The combined analysis of recombination dynamics and band structure suggests that performance improvements in MASnI3 solar cells require targeted defect management strategies:
Bulk defect passivation to suppress SRH recombination
Interface engineering to optimize band alignment and carrier extraction
Material stabilization to prevent Sn²⁺ oxidation and defect formation
Recent advances in material engineering, including additive incorporation and compositional tuning, have demonstrated significant improvements in device performance and stability (Wang et al., 2024).
MASnI3 solar cells show a non-linear thermal response. Voc and PCE rise up to ~400 K due to improved carrier mobility and reduced resistance (Table 9), but decline sharply beyond this point from non-radiative recombination and bandgap narrowing. Jsc remains nearly constant, while FF increases slightly before saturating. Overall, MASnI3 demonstrates moderate stability up to ~400 K, after which Sn²⁺ oxidation and lattice instability dominate (Leijtens et al., 2018).
Simulations show ~17–18% PCE across 300–440 K, outperforming MAPbI3 devices, which drop from ~21% to ~13% (Ouslimane et al., 2021). The simulated 17.31% efficiency at 300 K matches reported MASnI3 values (8.12–20.42%) (Zhao et al., 2017) and approaches optimized projections of ~23.35% (Roy et al., 2021).
Table 9: Thermal Stability of MASnI3 Solar Cell
| Temperature (K) | Voc (V) | Jsc (mA/cm2) | FF (%) | Power conversion efficiency (%) |
|---|---|---|---|---|
| 300 | 0.8189 | 33.821071 | 62.49 | 17.31 |
| 320 | 0.8216 | 33.823847 | 62.78 | 17.45 |
| 340 | 0.8246 | 33.825104 | 63.02 | 17.58 |
| 360 | 0.8277 | 33.827721 | 63.24 | 17.71 |
| 380 | 0.8297 | 33.828955 | 63.53 | 17.83 |
| 400 | 0.8275 | 33.832226 | 64.05 | 17.93 |
| 420 | 0.8156 | 33.835630 | 65.08 | 17.96 |
| 440 | 0.7905 | 33.836992 | 66.64 | 17.82 |
| 460 | 0.7609 | 33.839842 | 67.66 | 17.42 |
| 480 | 0.7311 | 33.842745 | 67.68 | 16.74 |
| 500 | 0.7011 | 33.845638 | 66.92 | 15.88 |
The simulated device demonstrates enhanced thermal stability, maintaining a ~17–18% PCE across 300–440 K, outperforming the MAPbI3-based architecture(Figure 6), which declined from ~21% to ~13% over a comparable range (Ouslimane et al., 2021).This improvement is attributed to optimized device architecture and interface engineering. The simulated efficiency of 17.31% at 300 K aligns with experimental MASnI3 reports (8.12–20.42%) (Zhao et al., 2017) and approaches numerically projected values up to 23.35% with optimized electron transport layers (Roy et al., 2021).
Efficiency peaks at ~17.93% near 400 K (Afrin et al., 2024). Beyond this, degradation arises from:
Sn2+→Sn4+ oxidation causing recombination losses (Hao et al., 2014; Pesci et al., 2025).
Bandgap narrowing reducing Voc by ~14.4% between 420–500 K (Yu et al., 2011).
Thermal expansion and disorder introducing defects (Iglesias Porras, 2023).
Interfacial degradation increasing resistance and lowering FF (Schwenzer et al., 2018).
This study finds a coefficient of −0.024% K⁻¹ (300–500 K), far lower than −0.167 to −0.176% K⁻¹ reported by Roy et al. (2021), confirming improved resilience.
Implications for Practical Applications Stability up to 400 K suits real-world operation where modules exceed 298 K (Mesquita et al., 2019). Retention of >17% efficiency to 420 K highlights deployment potential, though degradation beyond this requires encapsulation, thermal management, and interface engineering (Leijtens et al., 2018). Agreement with experiments validates the model and emphasizes defect dynamics and interface quality as key limitations(Wang et al., 2017).
Figure 6: Power conversion efficiency vs. temperature (300–450 K) for the proposed MASnI3 cell vs. Ouslimane et al. (2021).
To provide a concise overview of the relative influence of key input parameters on device performance, the results of the sensitivity analysis are summarized in Table 10. The analysis evaluates how variations in absorber thickness, defect density, band alignment, and temperature affect photovoltaic output (Voc, Jsc, FF, and PCE), enabling identification of the most critical factors governing device efficiency and stability.
Table 10: Summary of Sensitivity and Uncertainty Analysis of Key Device Parameters
| Parameter Varied | Range | Most Affected Output | Sensitivity Level | Key Observation | Impact on PCE |
|---|---|---|---|---|---|
| Absorber Thickness (µm) | 0.2 – 1.0 | Jsc ↑, FF ↓ | Moderate | Jsc increases with thickness due to improved light absorption, but FF decreases due to recombination losses | Optimal at 0.6 µm (17.31%) |
| Bulk Defect Density (cm⁻³) | 10⁹ – 10¹⁶ | Voc ↓, FF ↓↓↓ | Very High | Strong degradation due to SRH recombination; dominant loss mechanism | Drops from 25.05% → 4.47% |
| Interface Defect Density (cm⁻²) | 10⁷ – 10¹⁵ | FF ↓, Jsc ↓ | High | High interface traps increase recombination, especially at HTL interface | Drops from 17.31% → 9.12% |
| Band Offset (CBO/VBO) (eV) | −0.10 → +0.20 | Voc ↑, FF ↑ | High (Optimisation-sensitive) | Small positive offsets improve charge extraction; cliffs degrade performance | Peak ≈ 22.32% |
| Temperature (K) | 300 – 500 | Voc ↓, FF ↑ (initially) | Moderate | Thermal increase enhances transport but reduces Voc at high T | Peak ≈ 17.96% at 420 K |
The sensitivity analysis reveals that bulk defect density is the most critical parameter, followed by interface defects and band alignment, while absorber thickness and temperature exhibit moderate influence on device performance.
This study provides a comprehensive elucidation of position-dependent recombination mechanisms in TiO2/MASnI3/Spiro-OMeTAD perovskite solar cells through spatially resolved recombination analysis and energy band engineering. The results clearly demonstrate that bulk defect density is the dominant factor governing recombination losses and overall device performance. Specifically, devices with high bulk trap density (Nt = 10¹⁶ cm⁻³) exhibit significantly elevated recombination current densities (33.032 mA/cm²), corresponding to an ~87% increase compared to low-defect devices (17.667 mA/cm² at Nt = 10¹² cm⁻³).
In contrast, interface recombination at the MASnI3/Spiro-OMeTAD junction contributes minimally (0.755 mA/cm²), indicating that bulk defect mitigation is far more critical than interface engineering for performance optimization. Spatial recombination profiling across the 0.6 µm absorber layer reveals strong non-uniformity, with peak recombination localized within the space-charge region (0.25–0.45 µm), where electric-field gradients and carrier concentrations overlap, enhancing trap-assisted recombination.
Furthermore, energy-band analysis reveals significant degradation in the quasi-Fermi-level splitting under high-defect conditions, directly correlating with reduced open-circuit voltage (Voc) and fill factor (FF). Thermal stability analysis further reveals that the device maintains stable performance up to approximately 400 K, beyond which increased carrier recombination, bandgap narrowing, and Sn²⁺ oxidation significantly degrade photovoltaic performance. This temperature-dependent behavior underscores the critical interplay between defect density and thermal-induced instability in MASnI3-based devices. These findings establish key design guidelines:
Prioritization of bulk defect passivation to suppress non-radiative recombination
Enhancement of absorber crystallinity and grain boundary quality to maintain trap densities below 10¹² cm⁻³
Control of spatial defect uniformity to eliminate recombination hotspots, and (iv)
Implementation of thermal stabilization strategies to mitigate high-temperature degradation effects.
Future work should focus on advanced defect passivation strategies, including Lewis base incorporation, optimized thermal annealing for grain boundary engineering, compositional tuning to intrinsically reduce defect formation, and encapsulation or material engineering approaches to suppress thermal-induced degradation mechanisms. Additionally, coupling in-situ characterization techniques with predictive device modeling will be essential for establishing robust structure–property relationships.
Overall, this study provides a fundamental framework for the rational design of high-efficiency and thermally stable MASnI3-based perovskite solar cells, supporting their development as environmentally benign alternatives to lead-based photovoltaic technologies.
The authors declare that there is no conflict of interest regarding the publication of this manuscript. The research was conducted independently without any financial or commercial relationships that could be construed as a potential conflict of interest.
The authors acknowledge the use of SCAPS-1D simulation software developed by the University of Ghent for photovoltaic device modeling. The authors also appreciate the support of their institution (Yobe State University) for providing an enabling research environment.
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Table S1 summarizes all material baseline parameters used.
Table S 1 Key baseline material parameters used in SCAPS-1D simulations
| Parameter | TiO2 (ETL) | MASnI3 (Absorber) | Spiro-OMeTAD (HTL) |
|---|---|---|---|
| Thickness (µm) | 0.05 | 0.60 | 0.20 |
| Bandgap, (eV) | 3.20 | 1.30 | 3.00 |
| Electron Affinity (eV) | 4.20 | 4.17 | 2.40 |
| Dielectric Constant | 9.0 | 25.0 | 3.0 |
| Electron Mobility(cm2 V-1 s-1) | 20 | 400 | 2×10−4 |
| Hole Mobility(cm2 V-1 s-1) | 10 | 400 | 2×10−4 |
| Eff. Density of States Nc (cm-3) | 2.2×1018 | 1.0×1018 | 2.2×1018 |
| Eff. Density of States Nv (cm-3) | 1.8×1019 | 1.0×1019 | 1.8×1019 |
| Donor Density(cm-3) | 5.0×1018 | — | — |
| Acceptor Density(cm-3) | — | 1.0×1015 | 1.0×1018 |
| Bulk Defect Density(cm-3) | 1.0×1014 | 1.0×1013 | 1.0×1014 |
| Interface Defect Density (cm-2 eV-1) | — | 1.0×1012 | — |
| Contact Work Function (eV) | 4.40 (FTO) | — | 5.20 |
Table Note
Material parameters were adopted from previously reported experimental and simulation studies commonly used for SCAPS modeling of tin-based perovskite solar cells..
References:
Burgelman, M., Nollet, P., & Degrave, S. (2000). Modelling polycrystalline semiconductor solar cells. Thin solid films, 361, 527-532. doi:https://doi.org/10.1016/S0040-6090(99)00825-1
Calió, L., Kazim, S., Grätzel, M., & Ahmad, S. (2016). Hole‐transport materials for perovskite solar cells. Angewandte Chemie International Edition, 55(47), 14522-14545. doi:https://doi.org/10.1002/anie.201601757
Hao, F., Stoumpos, C. C., Cao, D. H., Chang, R. P., & Kanatzidis, M. G. (2014). Lead-free solid-state organic–inorganic halide perovskite solar cells. Nature photonics, 8(6), 489-494. doi:https://doi.org/10.1038/nphoton.2014.82
Jeon, N. J., Noh, J. H., Kim, Y. C., Yang, W. S., Ryu, S., & Seok, S. I. (2014). Solvent engineering for high-performance inorganic–organic hybrid perovskite solar cells. Nature materials, 13(9), 897-903. doi:https://doi.org/10.1038/nmat4014
Minami, T., Nishi, Y., & Miyata, T. (2015). Heterojunction solar cell with 6% efficiency based on an n-type aluminum–gallium–oxide thin film and p-type sodium-doped Cu2O sheet. Applied Physics Express, 8(2), 022301. doi:https://ui.adsabs.harvard.edu/link_gateway/2015APExp...8b2301M/doi:10.7567/APEX.8.022301
Noel, N. K., Stranks, S. D., Abate, A., Wehrenfennig, C., Guarnera, S., Haghighirad, A.-A., Sadhanala, A., Eperon, G. E., Pathak, S. K., & Johnston, M. B. (2014). Lead-free organic–inorganic tin halide perovskites for photovoltaic applications. Energy & Environmental Science, 7(9), 3061-3068. doi:https://doi.org/10.1039/C4EE01076K
Park, N.-G. (2013). Organometal perovskite light absorbers toward a 20% efficiency low-cost solid-state mesoscopic solar cell. The Journal of Physical Chemistry Letters, 4(15), 2423-2429. doi:https://doi.org/10.1021/jz400892a
Usman, A., & Bovornratanaraks, T. (2024). Modeling and optimization of modified TiO2 with aluminum and magnesium as ETL in MAPbI3 perovskite solar cells: SCAPS 1D frameworks. ACS omega, 9(38), 39663-39672. doi: https://doi.org/10.1021/acsomega.4c04505
S3. Interface Defect Density Analysis
S3.1 TiO2/MASnI3 Interface
Performance metrics remained stable up to 10¹¹ cm⁻².
Beyond 10¹² cm⁻²:
Voc decreases sharply
The increase in FF likely results from a redistribution of recombination pathways that alters the internal electric field and carrier extraction dynamics.
PCE decreases moderately
This behavior suggests partial compensation between increased interface recombination and enhanced carrier extraction dynamics.
Table S 2 Performance Variation with TiO2/MASnI3 Interface Defect Density
| Defect density \((\mathbf{cm}^{- \mathbf{2}})\) | Voc (V) | Jsc \((\mathbf{mA}/\mathbf{cm}^{\mathbf{2}})\) | FF (%) | Power conversion efficiency (%) |
|---|---|---|---|---|
| 1×108 | 0.8189 | 33.821071 | 62.49 | 17.31 |
| 1×109 | 0.8189 | 33.821071 | 62.49 | 17.31 |
| 1×1010 | 0.8189 | 33.821071 | 62.49 | 17.31 |
| 1×1011 | 0.8187 | 33.821035 | 62.44 | 17.29 |
| 1×1012 | 0.7456 | 33.820721 | 68.03 | 17.16 |
| 1×1013 | 0.6798 | 33.817847 | 71.86 | 16.52 |
S3.2 MASnI3/Spiro-OMeTAD Interface
Device performance degrades progressively beyond \(10^{12}\ \mathbf{cm}^{- \mathbf{2}}\).
At 1015 cm-2:
Jsc decreases significantly
The fill factor decreases sharply.
PCE drops below 10%
This confirms the HTL interface as the dominant recombination channel at high trap density.
Table S 3 Performance Variation with MASnI3/Spiro OMeTAD Interface Defect Density
| Defect density \((\mathbf{cm}^{- \mathbf{2}})\) | Voc (V) | Jsc\((\mathbf{mA}/\mathbf{cm}^{\mathbf{2}})\) | FF (%) | Power conversion efficiency (%) |
|---|---|---|---|---|
| 1×107 | 0.8189 | 33.821071 | 62.49 | 17.31 |
| 1×108 | 0.8189 | 33.821071 | 62.49 | 17.31 |
| 1×109 | 0.8189 | 33.820935 | 62.48 | 17.30 |
| 1×1010 | 0.8187 | 33.819574 | 62.39 | 17.27 |
| 1×1011 | 0.8180 | 33.806000 | 61.55 | 17.02 |
| 1×1012 | 0.8175 | 33.673179 | 57.62 | 15.86 |
| 1×1013 | 0.8163 | 32.583922 | 49.19 | 13.08 |
| 1×1014 | 0.8132 | 29.109153 | 42.22 | 10.00 |
| 1×1015 | 0.8119 | 27.252720 | 41.21 | 9.12 |
S4. Recombination Rate Profile R(x)
The spatial recombination rate R(x) across the device was extracted from SCAPS-1D to quantify the position-dependent recombination losses. Although the recombination profile was computed across the entire device thickness, the absorber region spans approximately 0.05–0.65 µm, corresponding to the 600 nm MASnI3 layer.
The recombination current density \(J_{rec}\) was obtained by numerical integration of the recombination profile using the trapezoidal rule:
\[J_{rec} = q\int_{0}^{L}{R(x)\, dx}\ \ \ \ \ \ \ \ \ \ \ \ \ \ \ \ \ \ (S1)\]
which was discretized as:
\[J_{rec} = q\sum_{i}^{}{\frac{\left( R_{i} + \ R_{(i + 1)} \right)}{2}\left( x_{(i + 1)} - x_{i} \right)}\ \ \ \ \ \ \ \ \ \ \ \ \ \ \ \ \ (S2)\]
where q is the elementary charge, R(x) is the position-dependent recombination rate, and x represents the spatial coordinate across the absorber thickness. The calculated recombination current densities were 17.667 mA cm⁻², 33.032 mA cm⁻², and 0.755 mA cm⁻² for the low bulk defect, high bulk defect, and interface-dominated cases, respectively, indicating that bulk trap density strongly governs recombination losses in MASnI3 absorbers, while interface traps contribute significantly only in the interface-dominated scenario.
Figure S 2 Spatial distribution of the recombination rate R(x) across the device under low bulk defect density conditions.
Figure S 3 Spatial distribution of the recombination rate R(x) across the device under high bulk defect density conditions.
Figure S 4 Spatial profile of the recombination rate R(x) for the interface-dominated case characterized by high trap density at the MASnI3/Spiro-OMeTAD interface.
Table S 4 Recombination profile — low bulk defects
| x (µm) | Δx (µm) | R(x) | Average R(x) | AverageR(x)Δx |
|---|---|---|---|---|
| 4.95E-02 | 5.11E-03 | 4.3181417E+20 | 4.2572667E+20 | 2.1762996E+18 |
| 5.46E-02 | 5.40E-03 | 4.1963916E+20 | 4.1334536E+20 | 2.2324883E+18 |
| 6.00E-02 | 5.67E-03 | 4.0705156E+20 | 4.0064063E+20 | 2.2701997E+18 |
| 6.56E-02 | 5.90E-03 | 3.9422971E+20 | 3.8777727E+20 | 2.2888289E+18 |
| 7.15E-02 | 6.10E-03 | 3.8132484E+20 | 3.7489701E+20 | 2.2882669E+18 |
| 7.77E-02 | 6.27E-03 | 3.6846918E+20 | 3.6212482E+20 | 2.2689251E+18 |
| 8.39E-02 | 6.38E-03 | 3.5578045E+20 | 3.4957206E+20 | 2.2317178E+18 |
| 9.03E-02 | 6.46E-03 | 3.4336367E+20 | 3.3733752E+20 | 2.1780113E+18 |
| 9.68E-02 | 6.48E-03 | 3.3131136E+20 | 3.2550720E+20 | 2.1095436E+18 |
| 1.03E-01 | 6.46E-03 | 3.1970303E+20 | 3.1415380E+20 | 2.0283261E+18 |
| 1.10E-01 | 6.38E-03 | 3.0860456E+20 | 3.0333620E+20 | 1.9365413E+18 |
| 1.16E-01 | 6.27E-03 | 2.9806783E+20 | 2.9309923E+20 | 1.8364390E+18 |
| 1.22E-01 | 6.10E-03 | 2.8813063E+20 | 2.8347372E+20 | 1.7302448E+18 |
| 1.28E-01 | 5.90E-03 | 2.7881682E+20 | 2.7447662E+20 | 1.6200796E+18 |
| 1.34E-01 | 5.67E-03 | 2.7013642E+20 | 2.6611089E+20 | 1.5078971E+18 |
| 1.40E-01 | 5.40E-03 | 2.6208535E+20 | 2.5836482E+20 | 1.3954346E+18 |
| 1.45E-01 | 5.11E-03 | 2.5464430E+20 | 2.5121043E+20 | 1.2841787E+18 |
| 1.51E-01 | 4.81E-03 | 2.4777656E+20 | 2.4460063E+20 | 1.1753479E+18 |
| 1.55E-01 | 4.49E-03 | 2.4142470E+20 | 2.3846565E+20 | 1.0698873E+18 |
| 1.60E-01 | 4.16E-03 | 2.3550659E+20 | 2.3270937E+20 | 9.6848869E+17 |
| 1.64E-01 | 3.84E-03 | 2.2991215E+20 | 2.2720745E+20 | 8.7162115E+17 |
| 1.68E-01 | 3.51E-03 | 2.2450274E+20 | 2.2180903E+20 | 7.7958908E+17 |
| 1.71E-01 | 3.20E-03 | 2.1911531E+20 | 2.1634392E+20 | 6.9259500E+17 |
| 1.75E-01 | 2.90E-03 | 2.1357254E+20 | 2.1063571E+20 | 6.1080249E+17 |
| 1.77E-01 | 2.61E-03 | 2.0769888E+20 | 2.0451943E+20 | 5.3438310E+17 |
| 1.80E-01 | 2.34E-03 | 2.0133998E+20 | 1.9786084E+20 | 4.6353471E+17 |
| 1.82E-01 | 2.09E-03 | 1.9438169E+20 | 1.9057301E+20 | 3.9846664E+17 |
| 1.84E-01 | 1.86E-03 | 1.8676434E+20 | 1.8262672E+20 | 3.3936500E+17 |
| 1.86E-01 | 1.65E-03 | 1.7848910E+20 | 1.7405231E+20 | 2.8634530E+17 |
| 1.88E-01 | 1.45E-03 | 1.6961553E+20 | 1.6493354E+20 | 2.3941060E+17 |
Table S 5 Recombination profile — high bulk defects
| x (µm) | Δx (µm) | R(x) | Average R(x) | AverageR(x)Δx |
|---|---|---|---|---|
| 4.95E-02 | 5.11E-03 | 4.3166603E+20 | 4.2557672E+20 | 2.1755331E+18 |
| 5.46E-02 | 5.40E-03 | 4.1948741E+20 | 4.1319379E+20 | 2.2316696E+18 |
| 6.00E-02 | 5.67E-03 | 4.0690017E+20 | 4.0049064E+20 | 2.2693498E+18 |
| 6.56E-02 | 5.90E-03 | 3.9408112E+20 | 3.8763077E+20 | 2.2879641E+18 |
| 7.15E-02 | 6.10E-03 | 3.8118042E+20 | 3.7475503E+20 | 2.2874003E+18 |
| 7.77E-02 | 6.27E-03 | 3.6832964E+20 | 3.6198785E+20 | 2.2680669E+18 |
| 8.39E-02 | 6.38E-03 | 3.5564607E+20 | 3.4944029E+20 | 2.2308765E+18 |
| 9.03E-02 | 6.46E-03 | 3.4323451E+20 | 3.3721091E+20 | 2.1771939E+18 |
| 9.68E-02 | 6.48E-03 | 3.3118732E+20 | 3.2538561E+20 | 2.1087557E+18 |
| 1.03E-01 | 6.46E-03 | 3.1958391E+20 | 3.1403699E+20 | 2.0275720E+18 |
| 1.10E-01 | 6.38E-03 | 3.0849008E+20 | 3.0322382E+20 | 1.9358239E+18 |
| 1.16E-01 | 6.27E-03 | 2.9795757E+20 | 2.9299077E+20 | 1.8357595E+18 |
| 1.22E-01 | 6.10E-03 | 2.8802398E+20 | 2.8336835E+20 | 1.7296016E+18 |
| 1.28E-01 | 5.90E-03 | 2.7871273E+20 | 2.7437287E+20 | 1.6194672E+18 |
| 1.34E-01 | 5.67E-03 | 2.7003300E+20 | 2.6600604E+20 | 1.5073030E+18 |
| 1.40E-01 | 5.40E-03 | 2.6197907E+20 | 2.5825385E+20 | 1.3948353E+18 |
| 1.45E-01 | 5.11E-03 | 2.5452864E+20 | 2.5108423E+20 | 1.2835335E+18 |
| 1.51E-01 | 4.81E-03 | 2.4763982E+20 | 2.4444328E+20 | 1.1745918E+18 |
| 1.55E-01 | 4.49E-03 | 2.4124674E+20 | 2.3825063E+20 | 1.0689226E+18 |
| 1.60E-01 | 4.16E-03 | 2.3525451E+20 | 2.3239477E+20 | 9.6717940E+17 |
| 1.64E-01 | 3.84E-03 | 2.2953504E+20 | 2.2673068E+20 | 8.6979217E+17 |
| 1.68E-01 | 3.51E-03 | 2.2392632E+20 | 2.2108190E+20 | 7.7703345E+17 |
| 1.71E-01 | 3.20E-03 | 2.1823747E+20 | 2.1524945E+20 | 6.8909120E+17 |
| 1.75E-01 | 2.90E-03 | 2.1226143E+20 | 2.0902821E+20 | 6.0614105E+17 |
| 1.77E-01 | 2.61E-03 | 2.0579499E+20 | 2.0222944E+20 | 5.2839965E+17 |
| 1.80E-01 | 2.34E-03 | 1.9866390E+20 | 1.9470624E+20 | 4.5614435E+17 |
| 1.82E-01 | 2.09E-03 | 1.9074859E+20 | 1.8637705E+20 | 3.8969336E+17 |
| 1.84E-01 | 1.86E-03 | 1.8200552E+20 | 1.7724230E+20 | 3.2935943E+17 |
| 1.86E-01 | 1.65E-03 | 1.7247907E+20 | 1.6738972E+20 | 2.7538421E+17 |
| 1.88E-01 | 1.45E-03 | 1.6230037E+20 | 1.5698607E+20 | 2.2787439E+17 |
Table S 6 Recombination profile — Interface dominated (at the MASnI3 /Spiro-OMeTAD interface)
| x (µm) | Δx (µm) | R(x) | Average R(x) | AverageR(x)Δx |
|---|---|---|---|---|
| 4.95E-02 | 5.11E-03 | 4.3166610E+20 | 4.2557679E+20 | 2.1755335E+18 |
| 5.46E-02 | 5.40E-03 | 4.1948748E+20 | 4.1319386E+20 | 2.2316700E+18 |
| 6.00E-02 | 5.67E-03 | 4.0690024E+20 | 4.0049071E+20 | 2.2693502E+18 |
| 6.56E-02 | 5.90E-03 | 3.9408119E+20 | 3.8763084E+20 | 2.2879645E+18 |
| 7.15E-02 | 6.10E-03 | 3.8118049E+20 | 3.7475510E+20 | 2.2874007E+18 |
| 7.77E-02 | 6.27E-03 | 3.6832970E+20 | 3.6198792E+20 | 2.2680673E+18 |
| 8.39E-02 | 6.38E-03 | 3.5564613E+20 | 3.4944035E+20 | 2.2308769E+18 |
| 9.03E-02 | 6.46E-03 | 3.4323457E+20 | 3.3721097E+20 | 2.1771943E+18 |
| 9.68E-02 | 6.48E-03 | 3.3118738E+20 | 3.2538567E+20 | 2.1087560E+18 |
| 1.03E-01 | 6.46E-03 | 3.1958397E+20 | 3.1403705E+20 | 2.0275724E+18 |
| 1.10E-01 | 6.38E-03 | 3.0849013E+20 | 3.0322388E+20 | 1.9358243E+18 |
| 1.16E-01 | 6.27E-03 | 2.9795763E+20 | 2.9299084E+20 | 1.8357599E+18 |
| 1.22E-01 | 6.10E-03 | 2.8802404E+20 | 2.8336843E+20 | 1.7296021E+18 |
| 1.28E-01 | 5.90E-03 | 2.7871281E+20 | 2.7437297E+20 | 1.6194678E+18 |
| 1.34E-01 | 5.67E-03 | 2.7003314E+20 | 2.6600622E+20 | 1.5073040E+18 |
| 1.40E-01 | 5.40E-03 | 2.6197930E+20 | 2.5825418E+20 | 1.3948370E+18 |
| 1.45E-01 | 5.11E-03 | 2.5452907E+20 | 2.5108485E+20 | 1.2835367E+18 |
| 1.51E-01 | 4.81E-03 | 2.4764064E+20 | 2.4444447E+20 | 1.1745975E+18 |
| 1.55E-01 | 4.49E-03 | 2.4124829E+20 | 2.3825282E+20 | 1.0689325E+18 |
| 1.60E-01 | 4.16E-03 | 2.3525734E+20 | 2.3239869E+20 | 9.6719570E+17 |
| 1.64E-01 | 3.84E-03 | 2.2954004E+20 | 2.2673741E+20 | 8.6981797E+17 |
| 1.68E-01 | 3.51E-03 | 2.2393478E+20 | 2.2109298E+20 | 7.7707241E+17 |
| 1.71E-01 | 3.20E-03 | 2.1825119E+20 | 2.1526698E+20 | 6.8914730E+17 |
| 1.75E-01 | 2.90E-03 | 2.1228276E+20 | 2.0905478E+20 | 6.0621811E+17 |
| 1.77E-01 | 2.61E-03 | 2.0582681E+20 | 2.0226813E+20 | 5.2850074E+17 |
| 1.80E-01 | 2.34E-03 | 1.9870946E+20 | 1.9476036E+20 | 4.5627113E+17 |
| 1.82E-01 | 2.09E-03 | 1.9081126E+20 | 1.8644982E+20 | 3.8984550E+17 |
| 1.84E-01 | 1.86E-03 | 1.8208837E+20 | 1.7733636E+20 | 3.2953422E+17 |
| 1.86E-01 | 1.65E-03 | 1.7258434E+20 | 1.6750664E+20 | 2.7557657E+17 |
| 1.88E-01 | 1.45E-03 | 1.6242894E+20 | 1.5712584E+20 | 2.2807727E+17 |
The full numerical dataset used for the trapezoidal integration is available from the authors upon reasonable request.