Okpechi, K. U. P.; Nwaokorongwu, E. C.; Joseph, U.; Akwuegbu, C. O.; Ezere, U. Fabrication and Characterization of Aluminum-Doped Nickel Oxide Thin Films for Optoelectronic Applications Using the SILAR Method. USci 2024, 3 (4), 96-109. https://doi.org/10.56919/usci.2434.009.